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Texas Instruments SN74ABT8952DWR
IC SCAN TEST DEVICE 28SOIC
- Manufacturer
- Texas Instruments
- Datasheet
- Price
- 0.2
- Stock
- 10000
- Description
- IC SCAN TEST DEVICE 28SOIC
Product Details
- Series
- 74ACT
- Supplier Device Package
- 20-SOIC
- Function
- Universal
- Number of Bits per Element
- 8
- Packaging
- Tape & Reel (TR)
- Logic Type
- Shift Register
- Output Type
- Tri-State
- Part Status
- Active
- Mounting Type
- Surface Mount
- Package / Case
- 20-SOIC (0.295", 7.50mm Width)
- Base Part Number
- 74ACT299
- Voltage - Supply
- 4.5V ~ 5.5V
- Number of Elements
- 1
- Operating Temperature
- -55°C ~ 125°C