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Texas Instruments SN74BCT8373ADWRE4
IC SCAN TEST DEVICE LATCH 24SOIC
- Manufacturer
- Texas Instruments
- Datasheet
- Price
- 0.2
- Stock
- 10000
- Description
- IC SCAN TEST DEVICE LATCH 24SOIC
Product Details
- Supplier Device Package
- 24-PDIP
- Series
- 74BCT
- Packaging
- Tube
- Logic Type
- Scan Test Device with D-Type Latches
- Part Status
- Obsolete
- Mounting Type
- Through Hole
- Number of Bits
- 8
- Package / Case
- 24-DIP (0.300", 7.62mm)
- Supply Voltage
- 4.5V ~ 5.5V
- Base Part Number
- 74BCT8373
- Operating Temperature
- 0°C ~ 70°C