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Texas Instruments SN74LVTH182646APM
IC SCAN-TEST-DEV/XCVR 64-LQFP
- Manufacturer
- Texas Instruments
- Datasheet
- Price
- 0.2
- Stock
- 10000
- Description
- IC SCAN-TEST-DEV/XCVR 64-LQFP
Product Details
- Operating Temperature
- -40°C ~ 85°C
- Supplier Device Package
- 24-SOIC
- Series
- 74LVT
- Packaging
- Tube
- Logic Type
- Embedded Test-Bus Controllers
- Part Status
- Active
- Mounting Type
- Surface Mount
- Number of Bits
- 8
- Package / Case
- 24-SOIC (0.295", 7.50mm Width)
- Supply Voltage
- 2.7V ~ 3.6V
- Base Part Number
- 74LVT8980